MATERIALS DIAGNOSTICS

MATERIALS DIAGNOSTICS, the company providing service for the low energy (20 keV to 400 keV) and high energy (400 keV to 4.2 MeV) Ion Implantation of Metals, Semiconductors,and Superconductors working with four different Particle Accelerators. We accommodate small dimension to eight inch samples. We also perform nondestructive compositional analysis of thin films using RBS and PIXE techniques. Some of our other services include : Nuclear Reaction Analysis, Hydrogen profiling using ¹⁵N(p, alpha gamma) reaction, Carbon, Nitrogen, Sodium, Fluorine, and other elemental analysis, crystal structure using channeling, Micorbeam RBS, Microbeam PIXE; Elemental maps using microbeams,